Design and test of self-checking asynchronous control circuit

Authors:
Jian Ruan;Zhiying Wang;Kui Dai;Yong Li
Affiliations:
School of Computer, National University of Defense Technology, Changsha, Hunan, P. R. China;School of Computer, National University of Defense Technology, Changsha, Hunan, P. R. China;School of Computer, National University of Defense Technology, Changsha, Hunan, P. R. China;School of Computer, National University of Defense Technology, Changsha, Hunan, P. R. China
Venue:
PATMOS'07 Proceedings of the 17th international conference on Integrated Circuit and System Design: power and timing modeling, optimization and simulation
Year:
2007

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Abstract

The application of asynchronous circuit has been greatly restricted by reason of lacking effective technologies to test. Making use of the self-checking property of asynchronous control circuit, we may preferably solve this problem. In the paper, we put forward an improved, failstop David Cell, describe a way of designing self-checking asynchronous control circuits by the direct mapping technique, and propose the testing method for single stuck-at faults. The result shows that self-checking counterpart can be tested at normal operation speed and the area overhead is acceptable.