Automatic generation of synchronous test patterns for asynchronous circuits
DAC '97 Proceedings of the 34th annual Design Automation Conference
Detecting Exitory Stuck-At Faults in Semimodular Asynchronous Circuits
IEEE Transactions on Computers
The tangram framework (embedded tutorial): asynchronous circuits for low power
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Self-Timed Boundary-Scan Cells for Multi-Chip Module Test
Journal of Electronic Testing: Theory and Applications
5.2 Self-Timed Boundary-Scan Cells for Multi-Chip Module Test
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Synchronous Full-Scan for Asynchronous Handshake Circuits
Journal of Electronic Testing: Theory and Applications
Design automation of real-life asynchronous devices and systems
Foundations and Trends in Electronic Design Automation
Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology
Journal of Electronic Testing: Theory and Applications
Design and modeling of a low-power multi-channel integrated circuit for infrared gas recognition
Microprocessors & Microsystems
Design and test of self-checking asynchronous control circuit
PATMOS'07 Proceedings of the 17th international conference on Integrated Circuit and System Design: power and timing modeling, optimization and simulation
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