Programming in VLSI: from communicating processes to delay-insensitive circuits
Developments in concurrency and communication
Testing asynchronous circuits: a survey
Integration, the VLSI Journal
Compiling the language Balsa to delay insensitive hardware
CHDL'97 Proceedings of the IFIP TC10 WG10.5 international conference on Hardware description languages and their applications : specification, modelling, verification and synthesis of microelectronic systems: specification, modelling, verification and synthesis of microelectronic systems
Synthesis of asynchronous control circuits with automatically generated relative timing assumptions
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
The tangram framework (embedded tutorial): asynchronous circuits for low power
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Sequential Optimization of Asynchronous and Synchronous Finite-State Machines: Algorithms and Tools
Sequential Optimization of Asynchronous and Synchronous Finite-State Machines: Algorithms and Tools
Optimal Scan for Pipelined Testing: An Asynchronous Foundation
Proceedings of the IEEE International Test Conference on Test and Design Validity
Adding Synchronous and LSSD Modes to Asynchronous Circuits
ASYNC '02 Proceedings of the 8th International Symposium on Asynchronus Circuits and Systems
Scan testing of asynchronous sequential circuits
GLSVLSI '95 Proceedings of the Fifth Great Lakes Symposium on VLSI (GLSVLSI'95)
Automatic Scan Insertion and Test Generation for Asynchronous Circuits
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Testing macro-module-based self-timed circuits
Testing macro-module-based self-timed circuits
The VLSI-programming language tangram and its translation into handshake circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Principles of Asynchronous Circuit Design: A Systems Perspective
Principles of Asynchronous Circuit Design: A Systems Perspective
Design automation of real-life asynchronous devices and systems
Foundations and Trends in Electronic Design Automation
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Handshake circuits form a special class of asynchronous circuits that has enabled the industrial exploitation of the asynchronous potential such as low power, low electromagnetic emission, and increased cryptographic security. In this paper we present a test solution for handshake circuits that brings synchronous test-quality to asynchronous circuits. We add a synchronous mode of operation to handshake circuits that allows full controllability and observability during test. This technique is demonstrated on some industrial examples and gives over 99% stuck-at fault coverage, using test-pattern generators developed for synchronous circuits. The paper describes how such a full-scan mode can be achieved, including an approach to minimize the number of dummy latches in case latches are used in the data path of the handshake circuit.