A dynamic method for efficient random mismatch characterization of standard cells

  • Authors:
  • Wangyang Zhang;Amith Singhee;Jinjun Xiong;Peter Habitz;Amol Joshi;Chandu Visweswariah;James Sundquist

  • Affiliations:
  • IBM Systems and Technology Group, Hopewell Junction, NY;IBM Thomas J. Watson Research Center, Yorktown Heights, NY;IBM Thomas J. Watson Research Center, Yorktown Heights, NY;IBM Systems and Technology Group, Essex Junction, VT;IBM Systems and Technology Group, Essex Junction, VT;IBM Systems and Technology Group, Hopewell Junction, NY;IBM Systems and Technology Group, Essex Junction, VT

  • Venue:
  • Proceedings of the International Conference on Computer-Aided Design
  • Year:
  • 2012

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Abstract

To enable statistical static timing analysis, for each cell in a digital library, a timing model that considers variations must be characterized. In this paper, we propose a dynamic method to accurately and efficiently characterize a cell's delay and output slew as a function of random mismatch variations. Based on a tight error bound for characterization using partial devices, our method sequentially performs simulations based on decreasing importance of devices and stops when the error requirement is met. Results on an industrial 32nm library demonstrate that the proposed method achieves significantly better accuracy-efficiency trade-off compared to other partial finite differencing approaches.