Automated design of self-adjusting pipelines
Proceedings of the 45th annual Design Automation Conference
Path-RO: a novel on-chip critical path delay measurement under process variations
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Statistical analysis of circuit timing using majorization
Communications of the ACM - A Blind Person's Interaction with Technology
Process variation-aware performance analysis of asynchronous circuits
Microelectronics Journal
Flip-flop energy/performance versus clock slope and impact on the clock network design
IEEE Transactions on Circuits and Systems Part I: Regular Papers
A methodology for the characterization of process variation in NoC links
Proceedings of the Conference on Design, Automation and Test in Europe
Non-linear operating point statistical analysis for local variations in logic timing at low voltage
Proceedings of the Conference on Design, Automation and Test in Europe
Analyzing the impact of process variations on parametric measurements: novel models and applications
Proceedings of the Conference on Design, Automation and Test in Europe
Understanding the effect of process variations on the delay of static and domino logic
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
On confidence in characterization and application of variation models
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Statistical leakage power optimization of asynchronous circuits considering process variations
PATMOS'10 Proceedings of the 20th international conference on Integrated circuit and system design: power and timing modeling, optimization and simulation
Characterizing the impact of process variation on 45 nm NoC-based CMPs
Journal of Parallel and Distributed Computing
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
Residue arithmetic for variation-tolerant design of multiply-add units
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
Toward efficient spatial variation decomposition via sparse regression
Proceedings of the International Conference on Computer-Aided Design
Proceedings of the International Conference on Computer-Aided Design
A new uncertainty budgeting based method for robust analog/mixed-signal design
Proceedings of the 49th Annual Design Automation Conference
Comparison of modeling techniques in circuit variability analysis
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
Power Modeling and Characterization of Computing Devices: A Survey
Foundations and Trends in Electronic Design Automation
A dynamic method for efficient random mismatch characterization of standard cells
Proceedings of the International Conference on Computer-Aided Design
Low-power resource binding by postsilicon customization
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Automatic clustering of wafer spatial signatures
Proceedings of the 50th Annual Design Automation Conference
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Fixed origin corner square inspection layout regularity metric
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
Journal of Electronic Testing: Theory and Applications
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