Efficient algorithms for extracting the K most critical paths in timing analysis
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Gate sizing using a statistical delay model
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Logic Synthesis and Verification
Logic Synthesis and Verification
Statistical timing for parametric yield prediction of digital integrated circuits
Proceedings of the 40th annual Design Automation Conference
Timing Verification and the Timing Analysis program
DAC '82 Proceedings of the 19th Design Automation Conference
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
High-performance CMOS variability in the 65-nm regime and beyond
IBM Journal of Research and Development - Advanced silicon technology
Design for Manufacturability and Statistical Design: A Comprehensive Approach
Design for Manufacturability and Statistical Design: A Comprehensive Approach
An accurate sparse matrix based framework for statistical static timing analysis
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Statistical timing analysis using bounds and selective enumeration
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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