Gate sizing using a statistical delay model

  • Authors:
  • E. T. A. F. Jacobs;M. R. C. M. Berkelaar

  • Affiliations:
  • Design Automation Section, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands;Design Automation Section, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands

  • Venue:
  • DATE '00 Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 2000

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Abstract