Efficient algorithms for extracting the K most critical paths in timing analysis
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
PRIMA: passive reduced-order interconnect macromodeling algorithm
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Proceedings of the 37th Annual Design Automation Conference
TACO: timing analysis with coupling
Proceedings of the 37th Annual Design Automation Conference
Gate sizing using a statistical delay model
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Modeling and forecasting of manufacturing variations (embedded tutorial)
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
A general probabilistic framework for worst case timing analysis
Proceedings of the 39th annual Design Automation Conference
Death, taxes and failing chips
Proceedings of the 40th annual Design Automation Conference
Statistical timing for parametric yield prediction of digital integrated circuits
Proceedings of the 40th annual Design Automation Conference
Timing Verification and the Timing Analysis program
DAC '82 Proceedings of the 19th Design Automation Conference
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Assessment of True Worst Case Circuit Performance Under Interconnect Parameter Variations
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Fast statistical timing analysis handling arbitrary delay correlations
Proceedings of the 41st annual Design Automation Conference
STAC: statistical timing analysis with correlation
Proceedings of the 41st annual Design Automation Conference
Block-based Static Timing Analysis with Uncertainty
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Proceedings of the 42nd annual Design Automation Conference
Correlation-aware statistical timing analysis with non-gaussian delay distributions
Proceedings of the 42nd annual Design Automation Conference
Correlation-preserved non-gaussian statistical timing analysis with quadratic timing model
Proceedings of the 42nd annual Design Automation Conference
A general framework for accurate statistical timing analysis considering correlations
Proceedings of the 42nd annual Design Automation Conference
Statistical static timing analysis: how simple can we get?
Proceedings of the 42nd annual Design Automation Conference
Asymptotic probability extraction for non-normal distributions of circuit performance
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Process and environmental variation impacts on ASIC timing
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Statistical delay computation considering spatial correlations
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Proceedings of the 43rd annual Design Automation Conference
Proceedings of the 43rd annual Design Automation Conference
Analysis and modeling of CD variation for statistical static timing
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
A framework for statistical timing analysis using non-linear delay and slew models
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
A new statistical max operation for propagating skewness in statistical timing analysis
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Speeding up Monte-Carlo Simulation for Statistical Timing Analysis of Digital Integrated Circuits
VLSID '07 Proceedings of the 20th International Conference on VLSI Design held jointly with 6th International Conference: Embedded Systems
Innovative Design Platforms for Reliable SoCs in Advanced Nanometer Technologies
IOLTS '07 Proceedings of the 13th IEEE International On-Line Testing Symposium
Fast second-order statistical static timing analysis using parameter dimension reduction
Proceedings of the 44th annual Design Automation Conference
Non-linear statistical static timing analysis for non-Gaussian variation sources
Proceedings of the 44th annual Design Automation Conference
Victim alignment in crosstalk aware timing analysis
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
PERT as an aid to logic design
IBM Journal of Research and Development
Asymptotic waveform evaluation for timing analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical timing analysis using bounds and selective enumeration
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical Timing Analysis With Coupling
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Advances in Computation of the Maximum of a Set of Gaussian Random Variables
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical Timing Analysis: From Basic Principles to State of the Art
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Worst-case analysis and optimization of VLSI circuit performances
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Efficient linear circuit analysis by Pade approximation via the Lanczos process
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical static timing analysis using Markov chain Monte Carlo
Proceedings of the Conference on Design, Automation and Test in Europe
Statistical approach in a system level methodology to deal with process variation
CODES/ISSS '10 Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Improved CMOS (4;2) compressor designs for parallel multipliers
Computers and Electrical Engineering
Revisiting automated physical synthesis of high-performance clock networks
ACM Transactions on Design Automation of Electronic Systems (TODAES)
ACM Transactions on Embedded Computing Systems (TECS) - Special Section on ESTIMedia'10
| Hi-index | 0.00 |
As the device and interconnect physical dimensions decrease steadily in modern nanometer silicon technologies, the ability to control the process and environmental variations is becoming more and more difficult. As a consequence, variability is a dominant factor in the design of complex system-on-chip (SoC) circuits. A solution to the problem of accurately evaluating the design performance with variability is statistical static timing analysis (SSTA). Starting from the probability distributions of the process parameters, SSTA allows to accurately estimating the probability distribution of the circuit performance in a single timing analysis run. An excellent survey on SSTA was recently published [D. Blaauw, K. Chopra, A. Srivastava, L. Scheffer, Statistical timing analysis: from basic principles to state of the art, IEEE Trans. Computer-Aided Design 27 (2008) 589-607], where the authors presented a general overview of the subject and provided a comprehensive list of references. The purpose of this survey is complementary with respect to Blaauw et al. (2008), and presents the reader a detailed description of the main sources of process variation, as well as a more in-depth review and analysis of the most important algorithms and techniques proposed in the literature that have been applied for an accurate and efficient statistical timing analysis.