IBM Journal of Research and Development
High-speed signal propagation on lossy transmission lines
IBM Journal of Research and Development
A gate-delay model for high-speed CMOS circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
A half-micron CMOS logic generation
IBM Journal of Research and Development - Special issue: IBM CMOS technology
Electromigration and stress-induced voiding in fine Al and Al-alloy thin-filmed lines
IBM Journal of Research and Development
On a Pin Versus Block Relationship For Partitions of Logic Graphs
IEEE Transactions on Computers
Interconnect fabrication processes and the development of low-cost wiring for CMOS products
IBM Journal of Research and Development
Scalability of Programmable FIR Digital Filters
Journal of VLSI Signal Processing Systems
Highly Accurate Quasi-Static Modeling of Coupled Interconnects in CMOS Technology
Analog Integrated Circuits and Signal Processing
Damascene Copper electroplating for chip interconnections
IBM Journal of Research and Development - Electrochemical microfabrication
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