Gate sizing using Lagrangian relaxation combined with a fast gradient-based pre-processing step
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Linear programming for sizing, Vth and Vdd assignment
ISLPED '05 Proceedings of the 2005 international symposium on Low power electronics and design
Fast and effective gate-sizing with multiple-Vt assignment using generalized Lagrangian Relaxation
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Gate sizing by Lagrangian relaxation revisited
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Gate sizing and device technology selection algorithms for high-performance industrial designs
Proceedings of the International Conference on Computer-Aided Design
The ISPD-2012 discrete cell sizing contest and benchmark suite
Proceedings of the 2012 ACM international symposium on International Symposium on Physical Design
Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Numerically Convex Forms and Their Application in Gate Sizing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
High-performance gate sizing with a signoff timer
Proceedings of the International Conference on Computer-Aided Design
ISPD 2014 benchmarks with sub-45nm technology rules for detailed-routing-driven placement
Proceedings of the 2014 on International symposium on physical design
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Gate sizing and threshold voltage selection is an important step in the VLSI design process to optimize power and performance of a given netlist. In this paper, we provide an overview of the ISPD-2013 Discrete Cell Sizing Contest. Compared to the ISPD-2012 Contest, we propose improvements in terms of the benchmark suite and the timing models utilized. In this paper, we briefly describe the contest, and provide some details about the standard cell library, benchmark suite, timing infrastructure and the evaluation metrics.