DAC '96 Proceedings of the 33rd annual Design Automation Conference
Selection of Voltage Thresholds for Delay Measurement
Analog Integrated Circuits and Signal Processing - Special issue: analog design issues in digital VSLI circuits and systems
A new gate delay model for simultaneous switching and its applications
Proceedings of the 38th annual Design Automation Conference
Capturing crosstalk-induced waveform for accurate static timing analysis
Proceedings of the 2003 international symposium on Physical design
Equivalent Waveform Propagation for Static Timing Analysis
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Timing analysis considering spatial power/ground level variation
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Timing Analysis Considering Spatial Power/Ground Level Variation
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Integration, the VLSI Journal
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This paper describes an accurate and efficient gate level delay calculator that automatically characterizes and computes the gate delays of MOS circuits. The high accuracy is attributed to a sophisticated delay model, which includes an accurate representation of the waveform, a consistent and meaningful definition of delay, a consideration of waveform slope effects at both the input and output of a gate, and an innovative approach for handling transmission gate circuits. Meanwhile, the high efficient delay characterization is accomplished through a fast timing simulation technique instead of using a circuit simulation or a timing simulation technique, a theorem to reduce a two-dimensional delay table into a scaled one-dimensional table, and an incremental characterization process.The delay calculator has been used in a production timing analyzer and a production multiple delay simulator since 1986. The results show that the multiple delay simulator performs 5000 times faster than a SPICE-like circuit simulator at only 15% cost of accuracy. Gate delay models, delay characterization, and practical examples are presented in this paper.