An accurate and efficient gate level delay calculator for MOS circuits
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Static timing analysis including power supply noise effect on propagation delay in VLSI circuits
Proceedings of the 38th annual Design Automation Conference
Coping with buffer delay change due to power and ground noise
Proceedings of the 39th annual Design Automation Conference
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Timing Analysis in Presence of Power Supply and Ground Voltage Variations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Vectorless Analysis of Supply Noise Induced Delay Variation
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Timing analysis considering temporal supply voltage fluctuation
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Proceedings of the 2008 international symposium on Physical design
Timing Analysis Considering Temporal Supply Voltage Fluctuation
IEICE - Transactions on Information and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Worst-case performance prediction under supply voltage and temperature variation
Proceedings of the 12th ACM/IEEE international workshop on System level interconnect prediction
Integration, the VLSI Journal
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Spatial power/ground level variation causes power/ground level mismatch between driver and receiver, and the mismatch affects gate propagation delay. This work proposes a timing analysis method based on a concept called "PG level equalization" which is compatible with conventional STA frameworks. We equalize the power/ground levels of driver and receiver. The charging/discharging current variation due to equalization is compensated by replacing output load. We present an implementation method of the proposed concept, and demonstrate that the proposed method works well for multiple-input gates and RC load models.