A unified approach for timing verification and delay fault testing

Single Output Distributed Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures

Journal of Electronic Testing: Theory and Applications

Online Testing Approach for Very Deep-Submicron ICs

IEEE Design & Test

Correlations between path delays and the accuracy of performance prediction

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Diversity Analysis in the Presence of Delay Faults Affecting Duplex Systems

IEEE Transactions on Computers

Exploring linear structures of critical path delay faults to reduce test efforts

Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

a fuzzy model for path delay fault detection

IEEE Transactions on Very Large Scale Integration (VLSI) Systems