Efficient Totally Self-Checking Shifter Design

  • Authors:
  • Ricardo O. Duarte;M. Nicolaidis;H. Bederr;Y. Zorian

  • Affiliations:
  • Reliable Integrated Systems Group, TIMA-46, Avenue, Fé/lix Viallet, 38031, Grenoble, France/ Texas Instruments, 06271, Villeneuve Loubet Cedex, France/ and LogicVision, 101-Metro Drive, San Jo ...;Reliable Integrated Systems Group, TIMA-46, Avenue, Fé/lix Viallet, 38031, Grenoble, France/ Texas Instruments, 06271, Villeneuve Loubet Cedex, France/ and LogicVision, 101-Metro Drive, San Jo ...;Reliable Integrated Systems Group, TIMA-46, Avenue, Fé/lix Viallet, 38031, Grenoble, France/ Texas Instruments, 06271, Villeneuve Loubet Cedex, France/ and LogicVision, 101-Metro Drive, San Jo ...;Reliable Integrated Systems Group, TIMA-46, Avenue, Fé/lix Viallet, 38031, Grenoble, France/ Texas Instruments, 06271, Villeneuve Loubet Cedex, France/ and LogicVision, 101-Metro Drive, San Jo ...

  • Venue:
  • Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
  • Year:
  • 1998

Quantified Score

Hi-index 0.00

Visualization

Abstract

Self-checking designs will gain increasing interest in industrialapplications if they satisfy the following requirements: high faultcoverage, reduced hardware cost and reduced design effort. This work isaimed to reach these requirements for the design of self-checking shifters and is part of a broader project concerning the design of self-checkingdata paths.