Chip-level verification for parasitic coupling effects in deep-submicron digital designs

  • Authors:
  • Lun Ye;Foong-Charn Chang;Peter Feldmann;Nagaraj Ns;Rakesh Chadha;Frank Cano

  • Affiliations:
  • Bell Laboratories, Murray Hill, NJ;Bell Laboratories, Murray Hill, NJ;Bell Laboratories, Murray Hill, NJ;Texas Instruments Inc., Dallas, TX;Bell Laboratories, Murray Hill, NJ;Texas Instruments Inc., Stafford TX

  • Venue:
  • DATE '99 Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 1999

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Abstract