Measuring routing congestion for multi-layer global routing

Authors:
Tom Chen;Alkan Cengiz
Affiliations:
Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, CO;Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, CO
Venue:
GLSVLSI '00 Proceedings of the 10th Great Lakes symposium on VLSI
Year:
2000

Citing 9
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Abstract

We propose an accurate measure of channel routing density and its application to global routing. Our congestion metric calculation method considers the wire scenarios in a channel.