Transient power management through high level synthesis
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
Proceedings of the 40th annual Design Automation Conference
Pattern Selection for Testing of Deep Sub-Micron Timing Defects
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Distributed sleep transistor network for power reduction
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
A vectorless estimation of maximum instantaneous current for sequential circuits
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
On bounding the delay of a critical path
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Efficient Boolean characteristic function for fast timed ATPG
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Efficient Boolean characteristic function for timed automatic test pattern generation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Modeling and estimation of power supply noise using linear programming
Proceedings of the International Conference on Computer-Aided Design
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We present new techniques for estimating the maximum instantaneous current through the power supply lines for CMOS circuits. We investigate four different approaches: (1) timed-ATPG-based approach; (2) probability-based approach; (3) genetic algorithm-based approach; and (4) integer linear programming (ILP) approach. The first three approaches produce a tight lower bound on the maximum current. The ILP-based approach produces the exact solutions for small circuits, and tight upper bounds of the solutions for large circuits. Our experimental results show that the upper bounds produced by the ILP approach combined with the lower bounds produced by the other three approaches confine the exact solution for the maximum instantaneous current to a small range.