On static compaction of test sequences for synchronous sequential circuits
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Static compaction using overlapped restoration and segment pruning
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Proptest: a property based test pattern generator for sequential circuits using test compaction
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
An approach for improving the levels of compaction achieved by vector omission
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
State relaxation based subsequence removal for fast static compaction in sequential circuits
Proceedings of the conference on Design, automation and test in Europe
Proceedings of the conference on Design, automation and test in Europe
Static test sequence compaction based on segment reordering and accelerated vector restoration
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits
ATS '98 Proceedings of the 7th Asian Test Symposium
Sequential Circuit Test Generation Using Dynamic State Traversal
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Vector restoration based static compaction of test sequences for synchronous sequential circuits
ICCD '97 Proceedings of the 1997 International Conference on Computer Design (ICCD '97)
Test Vector Embedding into Accumulator-Generated Sequences: A Linear-Time Solution
IEEE Transactions on Computers
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