Modeling crosstalk noise for deep submicron verification tools

  • Authors:
  • P. Bazargan-Sabet;F. Ilponse

  • Affiliations:
  • LIP6, University of Paris 6, 4 Place Jussieu, 75005 Paris, France;LIP6, University of Paris 6, 4 Place Jussieu, 75005 Paris, France and ST-Microelectronics, 850 Rue Jean Monnet, 38926 Crolles, France

  • Venue:
  • Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 2001

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Abstract