Behavioral synthesis techniques for intellectual property protection
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Data remanence in semiconductor devices
SSYM'01 Proceedings of the 10th conference on USENIX Security Symposium - Volume 10
Data remanence in semiconductor devices
SSYM'01 Proceedings of the 10th conference on USENIX Security Symposium - Volume 10
Designing and implementing malicious hardware
LEET'08 Proceedings of the 1st Usenix Workshop on Large-Scale Exploits and Emergent Threats
Towards trojan-free trusted ICs: problem analysis and detection scheme
Proceedings of the conference on Design, automation and test in Europe
MERO: A Statistical Approach for Hardware Trojan Detection
CHES '09 Proceedings of the 11th International Workshop on Cryptographic Hardware and Embedded Systems
The detection of Trojan horse based on the data mining
FSKD'09 Proceedings of the 6th international conference on Fuzzy systems and knowledge discovery - Volume 1
Securing netlist-level FPGA design through exploiting process variation and degradation
Proceedings of the ACM/SIGDA international symposium on Field Programmable Gate Arrays
A qualitative security analysis of a new class of 3-d integrated crypto co-processors
Cryptography and Security
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The chip industry is finding new uses for reverse engineering-to defend patents, spur innovation, and trace product failures. Intellectual property negotiations rely on technical ammunition, and over the last decade or so, a handful of laboratories specializing in IC reverse engineering (including Taeus) have sprung up to provide it. As their clients will attest, the ability of these labs to dissect even the most complicated IC is essential for pinpointing cases of patent infringement, and also determining whether a patented technology is worth licensing or buying. Beyond that, semiconductor manufacturers turn to these reverse-engineering houses to get a sense of how their products stack up against the competition, to test the quality of their products, and to trace the root cause of device failures