Behavioral Model of Analog Circuits for Nonvolatile Memories with VHDL-AMS
Analog Integrated Circuits and Signal Processing
ACM Transactions on Embedded Computing Systems (TECS)
Program and Verify Word-Line Voltage Regulator for Multilevel Flash Memories
Analog Integrated Circuits and Signal Processing
Electrical Model For Program Disturb Faults in Non-Volatile Memories
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Error Correcting Strategy for High Speed and High Density Reliable Flash Memories
Journal of Electronic Testing: Theory and Applications
Microelectronic Engineering - Special issue: Proceedings of the 13th biennial conference on insulating films on semiconductors
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement
Journal of Electronic Testing: Theory and Applications
A transactional flash file system for microcontrollers
ATEC '05 Proceedings of the annual conference on USENIX Annual Technical Conference
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Decoding frequency permutation arrays under infinite norm
ISIT'09 Proceedings of the 2009 IEEE international conference on Symposium on Information Theory - Volume 4
Universal rewriting in constrained memories
ISIT'09 Proceedings of the 2009 IEEE international conference on Symposium on Information Theory - Volume 2
Charge pump circuits: an overview on design strategies and topologies
IEEE Circuits and Systems Magazine
Correcting charge-constrained errors in the rank-modulation scheme
IEEE Transactions on Information Theory
Correcting limited-magnitude errors in the rank-modulation scheme
IEEE Transactions on Information Theory
Permutation arrays under the Chebyshev distance
IEEE Transactions on Information Theory
Built-in self-repair schemes for flash memories
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Decoding frequency permutation arrays under Chebyshev distance
IEEE Transactions on Information Theory
Proceedings of the 50th Annual Design Automation Conference
Gain-enhanced monolithic charge pump with simultaneous dynamic gate and substrate control
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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From the Publisher:This book is devoted entirely to flash memories and has been designed to provide comprehensive information on basic memory cell structures, device physics and technology, simulation circuit architecture, system issues, testing and reliability. It also provides data on advanced subjects related on multi-level storage cells, embedded memories and system applications of flash memories.