Error Correcting Strategy for High Speed and High Density Reliable Flash Memories

  • Authors:
  • D. Rossi;C. Metra

  • Affiliations:
  • DEIS, University of Bologna, Viale Risorgimento 2, 40136, Bologna, Italy;DEIS, University of Bologna, Viale Risorgimento 2, 40136, Bologna, Italy

  • Venue:
  • Journal of Electronic Testing: Theory and Applications
  • Year:
  • 2003

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Abstract

The use of very deep submicron technology makes VLSI-based digital systems more susceptible to transient or soft errors, and thus compromises their reliability. This paper proposes an architecture inspired by the human immune system that allows tolerance ...