Power analysis techniques for SoC with improved wiring models

  • Authors:
  • Takeshi Sakamoto;Takashi Yamada;Mamoru Mukuno;Yoshifumi Matsushita;Yasoo Harada;Hiroto Yasuura

  • Affiliations:
  • SANYO Electric, Gifu, Japan;SANYO Electric, Gifu, Japan;SANYO Electric, Gifu, Japan;SANYO Electric, Gifu, Japan;SANYO Electric, Gifu, Japan;Kyushu University, Kasuga, Japan

  • Venue:
  • Proceedings of the 2002 international symposium on Low power electronics and design
  • Year:
  • 2002

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Abstract

This paper proposes two techniques for improving the accuracy of gate-level power analysis for system-on-a-chip (SoC).