Extraction of circuit models for substrate cross-talk
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
DAC '98 Proceedings of the 35th annual Design Automation Conference
Efficient techniques for accurate extraction and modeling of substrate coupling in mixed-signal IC's
DATE '99 Proceedings of the conference on Design, automation and test in Europe
A multigrid tutorial: second edition
A multigrid tutorial: second edition
SuPREME: Substrate and Power-delivery Reluctance-Enhanced Macromodel Evaluation
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
An improved direct boundary element method for substrate coupling resistance extraction
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
CAD for nanometer silicon design challenges and success
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Nanoelectronic circuits and systems
A green function-based parasitic extraction method for inhomogeneous substrate layers
Proceedings of the 42nd annual Design Automation Conference
Substrate resistance extraction with direct boundary element method
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Accurate modeling of substrate resistive coupling for floating substrates
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Model order reduction via eigen decomposition analysis
International Journal of Computer Applications in Technology
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The accurate modeling of noise-coupling effects caused by crosstalk through the substrate is an increasingly important concern for design and verification of analog, digital, and mixed systems. With the technique described here, designers can efficiently extract accurate substrate-coupling parameters from deep-submicron designs.