SuPREME: Substrate and Power-delivery Reluctance-Enhanced Macromodel Evaluation

  • Authors:
  • Tsung-Hao Chen;Clement Luk;Charlie Chung-Ping Chen

  • Affiliations:
  • University of Wisconsin-Madison;University of Wisconsin-Madison;National Taiwan University

  • Venue:
  • Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 2003

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Abstract

The recent demand for system-on-chip RF mixed-signal designand aggressive supply-voltage reduction require chip-level accurateanalysis of both the substrate and power delivery systems.Together with the rising frequency, low-k dielectric, copper interconnects,and high conductivity substrate, the inductance effectsraised serious concern recently.However, the increasing designcomplexity creates tremendous challenges for chip-level power-deliverysubstrate co-analysis.In this paper, we propose a noveland efficient reluctance-based passive model order reduction techniqueto serve these tasks.Our work, SuPREME(Substrate andPower-delivery Reluctance-Enhanced Macromodel Evaluation) notonly greatly reduces the computational complexity of previousreluctance-based model order algorithms but is also capable ofhandling large number of noise sources efficiently.To facilitatethe analysis of inductive substrate return paths and evaluate thehigh-frequency substrate coupling effects, we derive a novel RLKCsubstrate model from Maxwell's equations for the first time.Experimentalresults demonstrate the superior runtime and accuracyof SuPREME compared to the traditional MNA-based simulation.