An improved direct boundary element method for substrate coupling resistance extraction

  • Authors:
  • Xiren Wang;Wenjian Yu;Zeyi Wang;Xianlong Hong

  • Affiliations:
  • Tsinghua University, Beijing, China;Tsinghua University, Beijing, China;Tsinghua University, Beijing, China;Tsinghua University, Beijing, China

  • Venue:
  • GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
  • Year:
  • 2005

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Abstract

It is important to model the substrate coupling for mixed-signal circuit designs today. This paper presents an improved direct boundary element method (DBEM) for substrate resistance calculation, where only the boundary of substrate volumes is discretized and only the free-space Green function is used. At first, we discard some inessential unknowns to compress the linear system without accuracy loss. Then we make the coefficient matrix sparser. In this way, solving the linear system is greatly accelerated. Experiments on various substrates validate that DBEM is several to tens of times faster than DCT-accelerated Green's function methods and the eigendecomposition method, while preserving high accuracy. Besides, another experiment shows that this method is versatile for irregular substrates.