Optimal hardware pattern generation for functional BIST
DATE '00 Proceedings of the conference on Design, automation and test in Europe
A novel reseeding technique for accumulator-based test pattern generation
GLSVLSI '01 Proceedings of the 11th Great Lakes symposium on VLSI
On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST
Journal of Electronic Testing: Theory and Applications
Accumulator based deterministic BIST
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Methods to reduce test application time for accumulator-based self-test
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
4.3 Bit Serial Pattern Generation and Response Compaction Using Arithmetic Functions
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Non-Intrusive BIST for Systems-on-a-Chip
ITC '00 Proceedings of the 2000 IEEE International Test Conference
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Adders, subtracters, ALUs, and multipliers, which are available in many data paths, can be utilized to generate test patterns for built-in self-test. In this paper guidelines for the design of arithmetic pattern generators are developed. Experimental results show that the generated patterns achieve similar fault coverage as pseudo-random sequences and require about the same test length. Hence, instead of adding LFSR-based test registers, arithmetic pattern generators can be used, and performance degradation is avoided.