Test pattern generation based on arithmetic operations
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Arithmetic Additive Generators of Pseudo-Exhaustive Test Patterns
IEEE Transactions on Computers
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Arithmetic built-in self-test for embedded systems
Arithmetic built-in self-test for embedded systems
Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
Arithmetic Pattern Generators for Built-In Self-Test
ICCD '96 Proceedings of the 1996 International Conference on Computer Design, VLSI in Computers and Processors
Accumulator based deterministic BIST
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Multiplicative Window Generators of Pseudo-random Test Vectors
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Cellular automata for deterministic sequential test pattern generation
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Methods to reduce test application time for accumulator-based self-test
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
On applying the set covering model to reseeding
Proceedings of the conference on Design, automation and test in Europe
Reusing Scan Chains for Test Pattern Decompression
Journal of Electronic Testing: Theory and Applications
Non-Intrusive BIST for Systems-on-a-Chip
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Tailoring ATPG for Embedded Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
BIST Technique by Equally Spaced Test Vector Sequences
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
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