Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
A Deterministic Built-In Self-Test Generator Based on Cellular Automata Structures
IEEE Transactions on Computers
A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata
Journal of Electronic Testing: Theory and Applications
Optimal hardware pattern generation for functional BIST
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Evolving Cellular Automata for Self-Testing Hardware
ICES '00 Proceedings of the Third International Conference on Evolvable Systems: From Biology to Hardware
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Non-Intrusive BIST for Systems-on-a-Chip
ITC '00 Proceedings of the 2000 IEEE International Test Conference
| Hi-index | 0.00 |
This paper addresses the issue of identifying a Cellular Automaton able to generate deterministic input patterns to detect stuck-at faults inside an FSM. A suitable hardware structure is first identified. An evolutionary algorithm is then proposed, which directly identifies a Cellular Automaton able to reach a very good Fault Coverage. The novelty of the method consists in combining the generation of test patterns with the synthesis of a Cellular Automaton able to reproduce them. Experimental results are provided, which show that the proposed hardware architecture and algorithmic approach outperform more traditional solutions, based on ATPG tools and FSM synthesis, from the point of view of both applicability and area occupation, while reaching the same Fault Coverage.