Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
Automated BIST for Sequential Logic Synthesis
IEEE Design & Test
Circular Self-Test Path for FSMs
IEEE Design & Test
A Deterministic Built-In Self-Test Generator Based on Cellular Automata Structures
IEEE Transactions on Computers
Advanced Techniques for GA-based sequential ATPGs
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Implicit test pattern generation constrained to cellular automata embedding
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Cellular automata for deterministic sequential test pattern generation
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata
Journal of Electronic Testing: Theory and Applications
Evolving Cellular Automata for Self-Testing Hardware
ICES '00 Proceedings of the Third International Conference on Evolvable Systems: From Biology to Hardware
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This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the proposed approach, called C2BIST (Circular Cellular BIST) is that the same CA is used for generation and compaction, thus lowering substantially the area requirements. The configuration of the CA rules is performed through a Genetic Algorithm, that is shown to provide good results both in terms of fault coverage and number of reconfigurations. In many cases, no reconfiguration is necessary, and the corresponding area occupation is competitive with current BIST approaches.