Fundamentals of MCM Testing and Design-for-Testability
Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability
Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability
An Effective Multi-Chip BIST Scheme
Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability
Multichip Module Diagnosis by Product-Code Signatures
Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability
ATPG for Heat Dissipation Minimization During Test Application
IEEE Transactions on Computers
Quality-effective repair of multichip module systems
Journal of Systems Architecture: the EUROMICRO Journal - Defect and fault tolerance in VLSI Systems
A distributed BIST technique for diagnosis of MCM interconnections
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Designing Self-Testable Multi-Chip Modules
EDTC '96 Proceedings of the 1996 European conference on Design and Test
DS-LFSR: A New BIST TPG for Low Heat Dissipation
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Distributed Diagnosis of Interconnections in SoC and MCM Designs
Journal of Electronic Testing: Theory and Applications
Feasibility study of smart substrate multichip modules
ITC'94 Proceedings of the 1994 international conference on Test
ATPG for heat dissipation minimization during test application
ITC'94 Proceedings of the 1994 international conference on Test
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