A scheme for integrated controller-datapath fault testing
DAC '97 Proceedings of the 34th annual Design Automation Conference
Synthesis of controllers for full testability of integrated datapath-controller pairs
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Synthesis for Testability of Highly Complex Controllers by Functional Redundancy Removal
IEEE Transactions on Computers
A Hierarchical Test Generation Approach for Large Controllers
IEEE Transactions on Computers
Integrated test of interacting controllers and datapaths
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A complete testing strategy based on interacting and hierarchical FSMs
Integration, the VLSI Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Specification of large complexity controllers in industrial design environments is performed by means of a top-down methodology leading to a description based on a hierarchy of FSMs. This paper presents a set of algorithms which compare such hierarchical descriptions with their structural implementations to produce irredundant circuits for which test patterns are easily derived. These algorithms can be inserted into any commercial design flow, based on VHDL descriptions, thus creating a synthesis for testability environment which provides testable and optimized gate-level descriptions.