PODEM-X: An automatic test generation system for VLSI logic structures
DAC '81 Proceedings of the 18th Design Automation Conference
Structured trace diagnosis for LSSD board testing—an alternative to full fault simulated diagnosis
DAC '81 Proceedings of the 18th Design Automation Conference
Test generation costs analysis and projections
DAC '80 Proceedings of the 17th Design Automation Conference
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
AUTOMATIC SYSTEM LEVEL TEST GENERATION AND FAULT LOCATION FOR LARGE DIGITAL SYSTEMS
DAC '78 Proceedings of the 15th Design Automation Conference
Parallel fault backtracing for calculation of fault coverage
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Parallel X-fault simulation with critical path tracing technique
Proceedings of the Conference on Design, Automation and Test in Europe
| Hi-index | 0.00 |