Model generation of test logic for macrocell based designs
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
Debug Facilities in the TriMedia CPU64 Architecture
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Designing UltraSparc for Testability
IEEE Design & Test
Test and Debug Strategy of the PNX8525 Nexperia" Digital Video Platform System Chip
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Automatic generation of breakpoint hardware for silicon debug
Proceedings of the 41st annual Design Automation Conference
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Transaction-Based Communication-Centric Debug
NOCS '07 Proceedings of the First International Symposium on Networks-on-Chip
Debugging Distributed-Shared-Memory Communication at Multiple Granularities in Networks on Chip
NOCS '08 Proceedings of the Second ACM/IEEE International Symposium on Networks-on-Chip
A case-study in the use of scan in microSPARCTM testing and debug
ITC'94 Proceedings of the 1994 international conference on Test
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