A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level

On-Chip IDDQ Testing in the AE11 Fail-Stop Controller

IEEE Design & Test

Test and Reliability: Partners in IC Manufacturing, Part 2

IEEE Design & Test

CMOS IC reliability indicators and burn-in economics

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Analyzing the Need for ATPG Targeting GOS Defects

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Boolean and Current Detection of MOS Transistor with Gate Oxide Short

ITC '01 Proceedings of the 2001 IEEE International Test Conference

THE FAIL-STOP CONTROLLER AE11

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short

Journal of Electronic Testing: Theory and Applications

A compact DC model of gate Oxide short defect

Microelectronic Engineering - Special issue: Proceedings of the 13th biennial conference on insulating films on semiconductors

Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown

Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

Delay testing viability of gate oxide short defects

Journal of Computer Science and Technology

Encountering gate oxide breakdown with shadow transistors to increase reliability

Proceedings of the 21st annual symposium on Integrated circuits and system design