Fault Coverage Analysis for Physically-Based CMOS Bridging Faults at Different Power Supply Voltages

Detection of Defects Using Fault Model Oriented Test Sequences

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

DELAY-FAULT TESTING AND DEFECTS IN DEEP SUB-MICRON ICS - DOES CRITICAL RESISTANCE REALLY MEAN ANYTHING?

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects

ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design

Resistive Bridge Fault Modeling, Simulation and Test Generation

ITC '99 Proceedings of the 1999 IEEE International Test Conference

The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip

Journal of Electronic Testing: Theory and Applications

Automatic Test Pattern Generation for Resistive Bridging Faults

Journal of Electronic Testing: Theory and Applications

Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries

Integration, the VLSI Journal

Resistive bridging fault simulation of industrial circuits

Proceedings of the conference on Design, automation and test in Europe

SUPERB: Simulator utilizing parallel evaluation of resistive bridges

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Non-invasive pre-bond TSV test using ring oscillators and multiple voltage levels

Proceedings of the Conference on Design, Automation and Test in Europe