Stuck Fault and Current Testing Comparison Using CMOS Chip Test

MILEF: an efficient approach to mixed level automatic test pattern generation

EURO-DAC '92 Proceedings of the conference on European design automation

A Test Methodology for High Performance MCMs

Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability

BIFEST: a built-in intermediate fault effect sensing and test generation system for CMOS bridging faults

ACM Transactions on Design Automation of Electronic Systems (TODAES)

IDDQ Testing: Issues Present and Future

IEEE Design & Test

Power supply current detectability of SRAM defects

ATS '95 Proceedings of the 4th Asian Test Symposium

Test Strategy Sensitivity to Defect Parameters

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Resistive Bridge Fault Modeling, Simulation and Test Generation

ITC '99 Proceedings of the 1999 IEEE International Test Conference

A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Criteria for static current estimation: how good are they? an approach incorporating IC quality requirements

SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design

An off-chip IDDq current measurement unit for telecommunication ASICs

ITC'94 Proceedings of the 1994 international conference on Test

Defect classes - an overdue paradigm for CMOS IC testing

ITC'94 Proceedings of the 1994 international conference on Test

Variable supply voltage testing for analogue CMOS and bipolar circuits

ITC'94 Proceedings of the 1994 international conference on Test

Back annotation of physical defects into gate-level, realistic faults in digital ICs

ITC'94 Proceedings of the 1994 international conference on Test

An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis

Journal of Electronic Testing: Theory and Applications