One-Pass Redundancy Identification and Removal

Sequential redundancy identification using recursive learning

Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design

Synthesis of Sequential Circuits by Redundancy Removal and Retiming

Journal of Electronic Testing: Theory and Applications - Special issue on test synthesis

FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Simulation-Based Engineering for Industrial Competitive Advantage

IEEE Design & Test

ATPG in practical and non-traditional applications

ITC '98 Proceedings of the 1998 IEEE International Test Conference

8.3 On Removing Redundant Faults in Synchronous Sequential Circuits

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

Synthesis for Testability by Sequential Redundancy Removal Using Retiming

FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing

Sequentially untestable faults identified without search: ("simple implications beat exhaustive search!")

ITC'94 Proceedings of the 1994 international conference on Test