Delay Testing with Clock Control: An Alternative to Enhanced Scan

On primitive fault test generation in non-scan sequential circuits

Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design

Distributed BIST Architecture to Combat Delay Faults

Journal of Electronic Testing: Theory and Applications

Digital oscillation-test method for delay and stuck-at fault testing of digital circuits

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Scan Latch Design for Test Applications

Journal of Electronic Testing: Theory and Applications

A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application

Proceedings of the conference on Design, Automation and Test in Europe - Volume 2

Controllability of Static CMOS Circuits for Timing Characterization

Journal of Electronic Testing: Theory and Applications

Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

Journal of Electronic Testing: Theory and Applications

A new delay test based on delay defect detection within slack intervals (DDSI)

IEEE Transactions on Very Large Scale Integration (VLSI) Systems