Using Partial Isolation Rings to Test Core-Based Designs
IEEE Design & Test
Testing Embedded Cores Using Partial Isolation Rings
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Tailoring ATPG for Embedded Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Modeling Custom Digital Circuits for Test
Journal of Electronic Testing: Theory and Applications
On systematic illegal state identification for pseudo-functional testing
Proceedings of the 46th Annual Design Automation Conference
A hierarchical environment for interactive test engineering
ITC'94 Proceedings of the 1994 international conference on Test
Parallel pattern fast fault simulation for three-state circuits and bidirectional I/O
ITC'94 Proceedings of the 1994 international conference on Test
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