Modeling Custom Digital Circuits for Test

  • Authors:
  • Soumitra Bose

  • Affiliations:
  • Intel Corporation, Parsippany 07054-4596

  • Venue:
  • Journal of Electronic Testing: Theory and Applications
  • Year:
  • 2004

Quantified Score

Hi-index 0.00

Visualization

Abstract

This paper presents a novel fault simulation environment in VHDL. By writing a library of special fault simulation models, a traditional model is transformed into a new model that performs fault simulation using a VHDL simulation engine. Pre- and post-synthesis ...