On-Chip Weighted Random Patterns
Journal of Electronic Testing: Theory and Applications
Distributed Generation of Weighted Random Patterns
IEEE Transactions on Computers
Efficient spectral techniques for sequential ATPG
Proceedings of the conference on Design, automation and test in Europe
State and Fault Information for Compaction-Based Test Generation
Journal of Electronic Testing: Theory and Applications
Characteristic faults and spectral information for logic BIST
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
10.3 Distributed Generation of Weighted Random Patterns
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
A BIST Pattern Generator Design for Near-Perfect Fault Coverage
IEEE Transactions on Computers
Low-power weighted pseudo-random BIST using special scan cells
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Testing Embedded Sequential Cores in Parallel Using Spectrum-Based BIST
IEEE Transactions on Computers
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