A structure and technique for pseudorandom-based testing of sequential circuits
Journal of Electronic Testing: Theory and Applications
Discrete-time signal processing (2nd ed.)
Discrete-time signal processing (2nd ed.)
Proptest: a property based test pattern generator for sequential circuits using test compaction
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Dynamic state traversal for sequential circuit test generation
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the conference on Design, automation and test in Europe
Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Vector restoration based static compaction of test sequences for synchronous sequential circuits
ICCD '97 Proceedings of the 1997 International Conference on Computer Design (ICCD '97)
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
State and Fault Information for Compaction-Based Test Generation
Journal of Electronic Testing: Theory and Applications
Efficient Sequential Test Generation Based on Logic Simulation
IEEE Design & Test
Characteristic faults and spectral information for logic BIST
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Efficient ATPG for Design Validation Based On Partitioned State Exploration Histories
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Testing Embedded Sequential Cores in Parallel Using Spectrum-Based BIST
IEEE Transactions on Computers
Mixed hierarchical-functional fault models for targeting sequential cores
Journal of Systems Architecture: the EUROMICRO Journal
Automatic test pattern generation with BOA
PPSN'06 Proceedings of the 9th international conference on Parallel Problem Solving from Nature
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