Built-in test generation for synchronous sequential circuits
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
A Novel Approach to Random Pattern Testing of Sequential Circuits
IEEE Transactions on Computers
On-Chip Weighted Random Patterns
Journal of Electronic Testing: Theory and Applications
Distributed Generation of Weighted Random Patterns
IEEE Transactions on Computers
Built-in generation of weighted test sequences for synchronous sequential circuits
DATE '00 Proceedings of the conference on Design, automation and test in Europe
On the Use of Fully Specified Initial States for Testing of Synchronous Sequential Circuits
IEEE Transactions on Computers
Efficient spectral techniques for sequential ATPG
Proceedings of the conference on Design, automation and test in Europe
A Unified DFT Approach for BIST and External Test
Journal of Electronic Testing: Theory and Applications
Deterministic Built-in Pattern Generation for Sequential Circuits
Journal of Electronic Testing: Theory and Applications
State and Fault Information for Compaction-Based Test Generation
Journal of Electronic Testing: Theory and Applications
Characteristic faults and spectral information for logic BIST
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Random pattern testing for sequential circuits revisited
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Degree-Of-Freedom Analysis for Sequential Machines Targeting BIST Quality and Gate Area
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Exploiting Ghost-FSMs as a BIST Structure for Sequential Machines
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
10.3 Distributed Generation of Weighted Random Patterns
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
19.1 Built-In Self Testing of Sequential Circuits Using Precomputed Test Sets
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Journal of Electronic Testing: Theory and Applications
Testing Embedded Sequential Cores in Parallel Using Spectrum-Based BIST
IEEE Transactions on Computers
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