DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
A structure and technique for pseudorandom-based testing of sequential circuits
Journal of Electronic Testing: Theory and Applications
On generating compact test sequences for synchronous sequential circuits
EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation
Built-in test generation for synchronous sequential circuits
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Design of an Efficient Weighted-Random-Pattern Generation System
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Deterministic Pattern Generation for Weighted Random Pattern Testing
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Sequential Circuit Test Generation Using Dynamic State Traversal
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Partial Set for Flip-Flops Based on State Requirement for Non-Scan BIST Scheme
ETW '99 Proceedings of the 1999 IEEE European Test Workshop
Random pattern testing for sequential circuits revisited
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
On Full Reset as a Design-For-Testability Technique
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
A new test pattern generation method for delay fault testing
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
19.1 Built-In Self Testing of Sequential Circuits Using Precomputed Test Sets
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
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