Test methodologies and design automation for IBM ASICs
IBM Journal of Research and Development
Efficient random testing with global weights
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
Algorithms to compute bridging fault coverage of IDDQ test sets
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On-Chip Weighted Random Patterns
Journal of Electronic Testing: Theory and Applications
Distributed Generation of Weighted Random Patterns
IEEE Transactions on Computers
Journal of Electronic Testing: Theory and Applications
Built-in generation of weighted test sequences for synchronous sequential circuits
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Proceedings of the 14th international symposium on Systems synthesis
System-on-Chip Testability Using LSSD Scan Structures
IEEE Design & Test
Test Set Embedding Based on Phase Shifters
EDCC-4 Proceedings of the 4th European Dependable Computing Conference on Dependable Computing
Deterministic Pattern Generation for Weighted Random Pattern Testing
EDTC '96 Proceedings of the 1996 European conference on Design and Test
On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
10.3 Distributed Generation of Weighted Random Patterns
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
OBDD-Based Optimization of Input Probabilities for Weighted Random Pattern Generation
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
A seed selection procedure for LFSR-based random pattern generators
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Random test generation with input cube avoidance
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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