A structure and technique for pseudorandom-based testing of sequential circuits
Journal of Electronic Testing: Theory and Applications
A Tutorial on Built-In Self-Test, Part 2: Applications
IEEE Design & Test
Random pattern testing for sequential circuits revisited
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
ICCD '98 Proceedings of the International Conference on Computer Design
Hardware-optimal test register insertion
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Exploiting Ghost-FSMs as a BIST Structure for Sequential Machines
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Journal of Electronic Testing: Theory and Applications
Efficient BIST design for sequential machines using FiF-FoF values in machine states
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
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This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some act as a sink under any input sequence. The proposed scheme provides uniform mobility, referred to as degree of freedom, among the machine states in test mode by enhancing the reachability and emitability of the states. Uniform mobility of states ensures higher fault efficiency in a BIST structure. A graph based approach is introduced for state code assignment to minimize gate area. Experimental results on benchmark circuits establish that the proposed scheme does improve the BIST quality simultaneously reducing the gate area of the synthesized machine.