ROC-1: Hardware Support for Recovery-Oriented Computing
IEEE Transactions on Computers - Special issue on fault-tolerant embedded systems
Dynamic Fault Tolerance in FPGAs via Partial Reconfiguration
FCCM '00 Proceedings of the 2000 IEEE Symposium on Field-Programmable Custom Computing Machines
A Highly-Efficient Transparent Online Memory Test
ITC '01 Proceedings of the 2001 IEEE International Test Conference
GRAAL: a Tool for Highly Dependable SRAMs Generation
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Improving On-Line BIST-Based Diagnosis for Roving STARs
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
BIST-Based Delay-Fault Testing in FPGAs
Journal of Electronic Testing: Theory and Applications
Using Roving STARs for On-Line Testing and Diagnosis of FPGAs in Fault-Tolerant Applications
ITC '99 Proceedings of the 1999 IEEE International Test Conference
High-diagnosability online built-in self-test of FPGAs via iterative bootstrapping
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Efficient on-line interconnect testing in FPGAs with provable detectability for multiple faults
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Online fault tolerance for FPGA logic blocks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient Concurrent Self-Test with Partially Specified Patterns
Journal of Electronic Testing: Theory and Applications
Online BIST and BIST-based diagnosis of FPGA logic blocks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper analyzes the effect of dormant faults on the mean time to failure (MTTF) of highly reliable systems. The analysis is performed by means of Markov models that allow quantifying the effect of dormant faults and other vital reliability parameters. It turns out that the presence of dormant faults can drastically reduce the MTTF of a system, particularly if the operating system allows a sporadic ("event-driven") change from a regular mode of operation to another mode. Virtually every practical system involves such a change, at least in case of emergency.It is demonstrated that on-line built-in self-test (BIST) is an effective means to overcome the deteriorating effect of dormant faults and re-establish a high MTTF. A very moderate test period may already be sufficient. The analysis is performed for the example of a fail-silent communication system for safety-critical real-time applications.