Generation of search state equivalence for automatic test pattern generation

Authors:
Xinghao Chen;M. L. Bushnell
Affiliations:
-;-
Venue:
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
Year:
1995

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Abstract

We present a generalization of the equivalent search state (EST) approach for test generation. A search state represents the current search status based on prior search decisions. The generalized EST identifies 56% more previously-searched decision spaces than its predecessor on the 1985 ISCAS benchmarks. We present the enabling theorem with a proof, results and an example for sequential circuit test generation.