Delay fault coverage and performance tradeoffs
DAC '93 Proceedings of the 30th international Design Automation Conference
Fast identification of robust dependent path delay faults
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
An efficient non-enumerative method to estimate path delay fault coverage
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Delay Testing for Non-Robust Untestable Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A Method for Identifying Robust Dependent and Functionally Unsensitizable Paths
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Selection of Potentially Testable Path Delay Faults for Test Generation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Detection of multiple transitions in delay fault test of SPARC64 microprocessor
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
On effective criterion of path selection for delay testing
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
| Hi-index | 0.00 |
We describe a path selection procedure that selects target faults for path delay fault test generation. Since large numbers of path delay faults may be untestable, the proposed procedure does not select a fixed set of paths. Instead, it provides compactly represented subsets of paths, referred to as superpaths, and allows the test generation procedure to select one path out of each subset based on testability considerations.